Measuring Perceived Clutter in Concept Diagrams

Tie Hou, Peter Chapman, Ian Oliver

Research output: Chapter in Book/Conference proceeding with ISSN or ISBNConference contribution with ISSN or ISBNpeer-review

Fingerprint

Dive into the research topics of 'Measuring Perceived Clutter in Concept Diagrams'. Together they form a unique fingerprint.

Engineering & Materials Science