Predicting the wettability of patterned ITO surface using ToF-SIMS images

L. Yang, A. G. Shard, J. L.S. Lee, S. Ray

    Research output: Contribution to journalArticlepeer-review

    Fingerprint

    Dive into the research topics of 'Predicting the wettability of patterned ITO surface using ToF-SIMS images'. Together they form a unique fingerprint.

    Keyphrases

    Material Science

    Engineering

    Chemical Engineering