Effects of low energy carbon ions on plasmid DNA

C. A. Hunniford, D. J. Timson, R. J.H. Davies, R. W. McCullough

    Research output: Contribution to journalArticlepeer-review


    The damage induced in supercoiled plasmid DNA molecules by low energy (< 1 keV u-1) singly and doubly charged carbon ions has been investigated as a function of ion exposure. The production of short linear fragments through multiple double strand breakage is indicated and exponential exposure responses for each of the topoisomers are presented. The damage produced by C2+ is apparent at much lower ion exposures that with C+.

    Original languageEnglish
    Article number012012
    JournalJournal of Physics: Conference Series
    Issue number1
    Publication statusPublished - 1 Feb 2008


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