Edge profile of commercially available square edged intraocular lenses: Part 2

Mayank Nanavaty; Ieva Zukaite; Jonathan Salvage

doi:10.1016/j.jcrs.2018.12.004

Edge profile of commercially available square edged intraocular lenses: Part 2

Mayank Nanavaty
, Ieva Zukaite
, Jonathan Salvage

Research output: Contribution to journal › Article › peer-review

Original language	English
Journal	Journal of Cartaract & Refractive Surgery
DOIs	https://doi.org/10.1016/j.jcrs.2018.12.004
Publication status	Published - 7 Dec 2018

Keywords

Intraocular lenses
Scanning electron microscopy
IOL

Access to Document

10.1016/j.jcrs.2018.12.004

Edge profile of commercially available square edged intraocular lenses: Part 2Accepted author manuscript, 2.83 MBLicence: CC BY-NC-ND

https://www.jcrsjournal.org/article/S0886-3350(18)30999-4/abstract

Environmental Scanning Electron Microscope EVO SEM
Facility/equipment: Equipment

Cite this

@article{03689bac546b4ea9ada8b8043f3730fe,

title = "Edge profile of commercially available square edged intraocular lenses: Part 2",

keywords = "Intraocular lenses, Scanning electron microscopy, IOL",

author = "Mayank Nanavaty and Ieva Zukaite and Jonathan Salvage",

year = "2018",

month = dec,

day = "7",

doi = "10.1016/j.jcrs.2018.12.004",

language = "English",

journal = "Journal of Cartaract \& Refractive Surgery",

issn = "0886-3350",

publisher = "Elsevier",

}

TY - JOUR

T1 - Edge profile of commercially available square edged intraocular lenses

T2 - Part 2

AU - Nanavaty, Mayank

AU - Zukaite, Ieva

AU - Salvage, Jonathan

PY - 2018/12/7

Y1 - 2018/12/7

KW - Intraocular lenses

KW - Scanning electron microscopy

KW - IOL

U2 - 10.1016/j.jcrs.2018.12.004

DO - 10.1016/j.jcrs.2018.12.004

M3 - Article

SN - 0886-3350

JO - Journal of Cartaract & Refractive Surgery

JF - Journal of Cartaract & Refractive Surgery

ER -

Edge profile of commercially available square edged intraocular lenses: Part 2

Keywords

Access to Document

Equipment

Environmental Scanning Electron Microscope EVO SEM

Cite this