The Carl Zeiss SIGMA Field Emission Scanning Electron Microscope FEG-SEM delivers advanced analytical microscopy.
Equipped with the GEMINI column with its in-lens secondary electron detection, the SIGMA FEG-SEM provides unparalleled resolution, contrast and brightness for imaging highly topographical samples.
The GEMINI column design provides low voltage imaging and stability allowing high quality imaging for beam sensitive and non-conducting specimens.
The electron source is a field emission gun, which emits electrons in a parallel beam enabling better spatial separation of objects of interest so that structures as small as (circa) 1.5 nm can be resolved.
The FEG-SEM is also equipped with a cryo preparation system. Cryo-SEM techniques have become essential for the observation of wet or 'beam sensitive' specimens, removing the need for conventional preparation techniques, such as critical point drying or freeze-drying, and allows observation of the specimen in its natural hydrated state.
Scanning transmission electron microscopy (STEM) is made possible through a retractable STEM detector that can be used to produce both Bright Field (BF) and Dark Field (DF) images. It is also possible to mix the DF and BF signals.
An Oxford Instruments 80mm X-Max SDD detector alongside AztecEnergy EDS software provides full elemental analysis capabilities.