Dimension Atomic Force Microscope (AFM)

    Facility/equipment: Equipment

    • Location

      Lewes Road

      Huxley Building

      Brighton

      BN2 4GJ

      United Kingdom

    Equipments Details

    Description

    This Atomic Force Microscope is capable of measuring and imaging atomic scale features and forces on sample surfaces.

    The AFM can operate in two modes, contact and tapping, allowing a range of applications including surface topography, phase imaging, and force interactions. It can take samples up to 200mm in diameter and 12mm in thickness.

    The Dimension 3000 is situated on an air-table within a Vibration Isolation Chamber.

    Keywords

    • QD Chemistry

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